Patent:
DE102013205330A1, WO2014154371
Patent Family:: 050023544
10/2014
When using ultrasonic testing to inspect materials—especially with advanced multi-sensor arrays—the inspection process generates a massive amount of complex data that can be overwhelming to analyze. This new invention solves that problem by automatically combining multiple data scans taken at a single measurement point into a single, streamlined image. As a result, the overall data volume is drastically reduced without losing essential inspection detail. This makes it much faster and easier for technicians to evaluate the results and detect potential flaws.